文件名称:labview
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基于labview的IC图像缺陷检测.通过匹配得到IC的相对坐标,然后通过边缘发现得到各个引脚之间的位置,最后测量各个引脚之间的距离实现IC缺陷类型(弯曲/断裂等)-IC image defect detection based on labview By matching obtain relative coordinates of the IC, and then found between each pin position obtained through the edge, and finally measuring the distance between each pin on IC defect type (bending/breaking, etc.)
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