集成电路芯片测试仪是一个能对常用74LS系列芯片进行逻辑功能测试，并判别芯片好坏和鉴定芯片型号的检测装置。设计采用W78E516B单片机作为核心控制器件，以双W78E516B单片机主从机串口通信，键盘输入操作指令，通过编程实现对待测芯片逻辑功能的测试，将测试反馈结果与系统存储的正确逻辑功能相比较，确定待测芯片的型号及逻辑功能的正确性，利用WLA36液晶屏显示，并通过ISD140语音芯片对检测结果进行播报。-IC Tester is a common 74LS series chips can logically function testing, and discrimination and identification of good and bad chips chips detection device models. Design uses W78E516B MCU as the core control device, to double W78E516B SCM master slave communication port, keyboard input operation command, a programmable logic functions on the determination of the test, the test feedback and system memory compared to the correct logic to determine chips tested the correctness of model and logic function, using WLA36 LCD display, and through ISD140 voice chip on the test results were broadcast.