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  1. bist 2017 paper

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  2. A new low-power (LP) scan-based built-in selftest (BIST) technique is proposed based on weighted pseudorandom test pattern generation and reseeding. A new LP scan architecture is proposed, which supports both pseudorandom testing and deterministi
  3. 所属分类:VHDL编程

    • 发布日期:2025-06-18
    • 文件大小:1568768

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