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[VHDL编程source

说明:数据读取源代码,能将各种数据中的杂项去掉,得到所需要的数据-good ok source code
<guocong> 在 2025-06-10 上传 | 大小:1.06mb | 下载:0

[VHDL编程Simulate-CR-XR-EE-KT_2008_004

说明:Simulate CR XR-EE-KT_2008_004
<MR TRUONG> 在 2025-06-10 上传 | 大小:1.07mb | 下载:0

[VHDL编程Bist_codings

说明: In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also
<saravanan> 在 2025-06-10 上传 | 大小:14kb | 下载:0

[VHDL编程bist(1)

说明: In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also
<saravanan> 在 2025-06-10 上传 | 大小:3kb | 下载:0

[VHDL编程AES

说明:
<saravanan> 在 2025-06-10 上传 | 大小:495kb | 下载:0

[VHDL编程ADCGraph2

说明:VHDL PROGRAM & LAB SOLUTIONS
<Raghvendra Singh> 在 2025-06-10 上传 | 大小:1.13mb | 下载:0

[VHDL编程VHDL1332351087

说明:VHDL Concepts and Tutorial
<fpga> 在 2025-06-10 上传 | 大小:24kb | 下载:0

[VHDL编程i2cSlave_1

说明:This the first file that describes an i2CSlave interface.-This is the first file that describes an i2CSlave interface.
<SS> 在 2025-06-10 上传 | 大小:1kb | 下载:0

[VHDL编程i2cSlave_2

说明:Verilog source for i2C Slave device
<SS> 在 2025-06-10 上传 | 大小:2kb | 下载:0

[VHDL编程test_i2c_1

说明:Testbench for an i2c controlling an I2c slave device
<SS> 在 2025-06-10 上传 | 大小:1kb | 下载:0

[VHDL编程test_i2c_2

说明:Testbench part 2 for an i2c controlling an I2c slave device
<SS> 在 2025-06-10 上传 | 大小:2kb | 下载:0

[VHDL编程test_i2c_3

说明:Testbench file 3 for an i2c controlling an I2c slave device
<SS> 在 2025-06-10 上传 | 大小:1kb | 下载:0
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