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[VHDL编程] Simulate-CR-XR-EE-KT_2008_004
说明:Simulate CR XR-EE-KT_2008_004<MR TRUONG> 在 2025-06-10 上传 | 大小:1.07mb | 下载:0
[VHDL编程] Bist_codings
说明: In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also<saravanan> 在 2025-06-10 上传 | 大小:14kb | 下载:0
[VHDL编程] bist(1)
说明: In this paper, we have explained the purpose of FPGA testing. A built-in-self-test (BIST) is one type of testing. This test is performed internally to find any faults within a FPGA chip. This paper explains why testing is important to FPGAs. It also<saravanan> 在 2025-06-10 上传 | 大小:3kb | 下载:0
[VHDL编程] ADCGraph2
说明:VHDL PROGRAM & LAB SOLUTIONS<Raghvendra Singh> 在 2025-06-10 上传 | 大小:1.13mb | 下载:0
[VHDL编程] i2cSlave_1
说明:This the first file that describes an i2CSlave interface.-This is the first file that describes an i2CSlave interface.<SS> 在 2025-06-10 上传 | 大小:1kb | 下载:0
[VHDL编程] test_i2c_1
说明:Testbench for an i2c controlling an I2c slave device<SS> 在 2025-06-10 上传 | 大小:1kb | 下载:0
[VHDL编程] test_i2c_2
说明:Testbench part 2 for an i2c controlling an I2c slave device<SS> 在 2025-06-10 上传 | 大小:2kb | 下载:0
[VHDL编程] test_i2c_3
说明:Testbench file 3 for an i2c controlling an I2c slave device<SS> 在 2025-06-10 上传 | 大小:1kb | 下载:0